Ondax to showcase terahertz Raman probe at SPIE BiOS and Photonics West 2016

Jan. 15, 2016

The THz-Raman probe, available in 532, 785, 850, and 1064 nm wavelengths, simultaneously captures low-frequency and chemical fingerprint signals.

LFW Staff

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The THz-Raman probe, available in 532, 785, 850, and 1064 nm wavelengths, simultaneously captures low-frequency and chemical fingerprint signals, delivering both chemical composition and molecular structural analysis in a single measurement for process and lab environments. An interchangeable sample collection interface is compatible with a wide variety of probe tips, as well as vials, cuvette, and tablet holders, for use in in situ process monitoring, immersion, in-line testing, bulk, and sample testing applications.

SPIE BiOS/Photonics West booth numbers: 8550 (BiOS) and 740 (Photonics West)

To Learn More:

Contact: Ondax
Headquarters: Monrovia, CA
Product: THz-Raman probe
Key Features: 532, 785, 850, and 1064 nm wavelength versions available

What Ondax says:
View more information on the THz-Raman probe.

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About the Author

LFW Staff

Published since 1965, Laser Focus World—a brand and magazine for engineers, researchers, scientists, and technical professionals—provides comprehensive global coverage of optoelectronic technologies, applications, and markets. With 80,000+ qualified print subscribers in print and over a half-million annual visitors to our online content, we are the go-to source to access decision makers and stay in-the-know.