Photonics Wafer Probing Test System (Model 58635)

As technology in the photonics industry advances the applications broaden as well. This is evidenced in the expansive application of laser diodes in both consumer products and communication technology. To meet the demands of these markets, Chroma developed a product line (58635 series) of laser diode wafer testers using their advanced proprietary photoelectric measurement technologies.

The 58635 Series can probe test up to a 6" wafer and meet the stringent requirements of laser diode testing when coupled with Chroma's precision equipment, such as SMU (source and measurement unit) and temperature controller. As the parameters of photoelectric characteristics for laser diode are varied with temperature, the precision temperature control of 58635 Series is able to provide the most stable and accurate measured value.

The 58635 Series comprise three types of models for different test requirements, which are 58635-L (L-I-V Testing), 58635-N (Near Field Testing) and 58635-F (Far Field Testing).        

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