High Resolution, High Magnification to 12x UV, X-ray imaging

May 26, 2022

Star Tech Instruments has just released our newest products for measuring energy and beam images/profiles in the X-ray, XUV, EUV wavelengths from 1 - 410 nm.

STI now offers Instruments with NIST traceability from 5 nm to 410 nm and measurement capability down to 1 nm.

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