Veeco Instruments Inc

1 Terminal Dr
Plainview, NY 11803
United States
516-677-0200
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[email protected]

More Info on Veeco Instruments Inc

Provides solutions for nanoscale applications in the worldwide semiconductor, solar, data storage, HB-LED/wireless, and scientific research markets. Metrology products are used to measure at the nanoscale, and process equipment tools.

Press Releases

Courtesy of Veeco Instruments Inc
Veeco 300mm oxide system for hybrid-MBE BTO on Silicon epitaxy
First-Of-Its-Kind Solution For Barium Titanate Epitaxy on Silicon to Accelerate Datacom and Quantum Computing Applications Plainview, N.Y. (U.S.A) and Leuven (Belgium), January...

Articles

(Image credit: Veeco)
FIGURE 1. Optics used for UV laser applications.
How do different process conditions and post-deposition annealing impact optical films hafnium oxide and silicon oxide?
Photo 242617254 © Penchan Pumila | Dreamstime.com
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Let’s recap all the business announcements in photonics from August 2022.
(Image credit: Veeco)
The collaboration fabricates ALLOS 200 mm GaN-on-Si epiwafer technology products on Veeco Propel MOCVD systems.
The collaboration demonstrates ALLOS 200 mm GaN-on-Si epiwafer technology on the Veeco Propel MOCVD reactor system.
Content Dam Lfw Online Articles 2018 08 Spector Ibdweb
Optics manufacturer Edmund Optics has ordered the SPECTOR ion beam sputtering system from Veeco Instruments.
FIGURE 1. A schematic diagram of a conventional AMOLED display device with light emission through the semi-transparent metal cathode layer is shown.
Thermal evaporators that promote low particle defects in metal cathode layers allow OLED devices to compete with alternative display technologies.
Veeco completed its acquisition of Ultratech to expand its semiconductor device manufacturing expertise.
Veeco SPECTOR-HT ion-beam deposition system
The SPECTOR-HT ion-beam deposition (IBD) system creates optical thin-film coatings for optical applications such as precision optics, lasers, life sciences, biomedical devices...
FIGURE 1. A typical LED is based on a stack of gallium nitride layers grown epitaxially on a sapphire substrate (a). Patterned sapphire substrates can improve the light extraction efficiency (b).
Optical profiling provides 3D surface metrology for patterned sapphire substrates used in HB-LEDs.
Veeco
ScanAsyst and PeakForce QNM are scan modes for atomic-force microscopes.
(Courtesy of Veeco)
FIGURE 1. Veeco's NPFlex white-light interferometer provides noncontact 3-D areal surface characterization with subnanometer vertical resolution at every pixel for large samples, designed to complement measurements made with a CMM tool.
While numerous interferometry applications have made only small advances over the years, big leaps have occurred in vibration isolation and form measurement of aspheres.

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(Courtesy of Veeco)
FIGURE 1. Surface texture differs between cells that exhibit differing efficiency. Several PV cell images with different surface skew (Ssk) values are shown here (top). A linear relationship exists between Ssk and efficiency for these cells (bottom).
Optical profilers can increase yield and lower the overall production cost of solar cells through quantification, qualification, or monitoring.
FIGURE 1. An underlying fragment of unremoved photoresist hinders a mirror’s motion and consequently deforms its shape. This hidden micromirror defect is revealed and quantified by the Wyko NT1100 DMEMS Optical Profiler.
Three different technologies offer complementary metrology methods for measuring size, surface quality, and motion in a wide range of MEMS devices.
FIGURE 1. Dual ion-beam deposition, available in a commercial system, offers advantages for an increasing number of applications requiring ultra-low-loss films.
Thin-film specifications are pushing the envelope beyond the capabilities of conventional manufacturing methods. Dual ion-beam deposition provides coatings that meet these stringent...
FIGURE 1. Power-spectral-density software provides plots from analysis of AFM images captured on surfaces of quartz substrate uncoated (black), coated with single-layer lanthanum fluoride thin film (red), coated with three-layer fluoride-system thin film (purple), and coated with multilayer (42 alternating layers of magnesium fluoride and lanthanum fluoride) thin film (green). Horizontal bars cover the in-plane wavelengths to which total integrated backscattering measurements are sensitive at the indicated light wavelengths (that is, 633, 248, and 193 nm) [1].
AFM images and data are increasingly indispensable for technical decision-makers in industry: from contact lenses to thin-film transistors in liquid-crystal displays.
A laser element analyzer is used at a phosphate mine for near-real-time ore grading. This onsite application eliminates the time delay involved with sending samples to a central laboratory for analysis as in conventional inductively coupled plasma methods.
In keeping with the downward dip seen at many trade shows this year, Pittcon 2002 (March 17-22; New Orleans, LA) appeared quieter than at any time in the past decade. The event...
Veeco Instruments (Plainview, NY), a maker of metrology tools for the semiconductor industry, is acquiring two companies.