Artifex Engineering to showcase testing equipment range at SPIE Photonics West 2014

Jan. 24, 2014
LIV testing instrumentation for laser diodes and LEDs involves sweeping the current to the device and measuring the optical power output, as well as the voltage drop across the device.

LIV testing instrumentation for laser diodes and LEDs involves sweeping the current to the device and measuring the optical power output, as well as the voltage drop across the device. It may also involve measurement of the current output of an internal monitor photodiode as well as the optical spectrum of the device under test. Testing options for lasers and LEDs at all power ranges and packaging levels include ultrashort pulsed testing at the chip or bar level; continuous-wave (CW) and quasi-CW (QCW) testing of chip-on-submount (CoS); and CW and QCW testing of fully packaged units.

SPIE Photonics West booth number: 5302

To Learn More:

Contact:Artifex Engineering
Headquarters: Emden, Germany
Product: LIV test instrumentation
Key Features: Testing for lasers and LEDs at all power ranges and packaging levels

What Artifex Engineering says:
View more information on LIV test instrumentation.

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