Artifex Engineering to showcase testing equipment range at SPIE Photonics West 2014

    Jan. 24, 2014
    LIV testing instrumentation for laser diodes and LEDs involves sweeping the current to the device and measuring the optical power output, as well as the voltage drop across the device.
    Content Dam Lfw En Articles 2014 01 Artifex Engineering To Showcase Testing Equipment Range At Spie Photonics West 2014 Leftcolumn Article Thumbnailimage File

    LIV testing instrumentation for laser diodes and LEDs involves sweeping the current to the device and measuring the optical power output, as well as the voltage drop across the device. It may also involve measurement of the current output of an internal monitor photodiode as well as the optical spectrum of the device under test. Testing options for lasers and LEDs at all power ranges and packaging levels include ultrashort pulsed testing at the chip or bar level; continuous-wave (CW) and quasi-CW (QCW) testing of chip-on-submount (CoS); and CW and QCW testing of fully packaged units.

    SPIE Photonics West booth number: 5302

    To Learn More:

    Contact:Artifex Engineering
    Headquarters: Emden, Germany
    Product: LIV test instrumentation
    Key Features: Testing for lasers and LEDs at all power ranges and packaging levels

    What Artifex Engineering says:
    View more information on LIV test instrumentation.

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