Bruker Nano Surfaces releases LED wafer measurement system

The LumiMap Electroluminescence System provides electrical and optical measurements on epitaxially grown wafers for high-brightness LEDs.
Oct. 29, 2013
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The LumiMap Electroluminescence System provides electrical and optical measurements on epitaxially grown wafers for high-brightness LEDs. It measures forward and reverse IV characteristics, spectral intensity, wavelength, and spectral width measurements on 2–6 in. wafers, with a wide range of current settings.
Bruker Nano Surfaces
Camarillo, CA
www.bruker.com

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