The Apollo silicon drift detector series for transmission electron microscopes includes the XLT with a super-ultrathin window and the windowless XLTW version, which exhibits a 500% improvement in sensitivity for low-energy x-rays. It has a 30 mm2 sensor and fully integrated data-acquisition and signal-processing electronics. Software is included.
EDAX INTRODUCES APOLLO XLT SDD SERIES
FOR TRANSMISSION ELECTRON MICROSCOPE (TEM)
MAHWAH, NJ – EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has established a new standard in electron microscopy with its release of the Apollo Silicon Drift Detector (SDD) Series for the transmission electron microscope (TEM). The new series includes the Apollo XLT with a Super Ultra Thin Window (SUTW) and the Apollo XLTW, a windowless version.
"With the launch of the Apollo XLT SDD Series, EDAX introduces the world's first SDD for the TEM with data acquisition and signal processing electronics fully integrated into the detector,” comments Sun Park, Technical Product Manager for EDAX.
“The Apollo XLT detector eliminates the need for a separate electronics enclosure for signal processors. The integrated detector presents an elegant design that improves performance, facilitates installation and offers easy remote access via Ethernet from virtually any computer," he adds.
The Apollo XLT SDD Series offers superior collection efficiency with a uniquely designed 30mm2 sensor for TEM applications. The windowless version further maximizes the collection efficiency and improves sensitivity up to 500% for low-energy X-rays. As a result, the mapping speed and light element detection in low concentrations are greatly enhanced with the Apollo XLTW.
The Apollo XLT SDD Series is offered with TEAM™ Energy Dispersive Spectroscopy (EDS) software to provide the ultimate analytical solution for the TEM. TEAM™ EDS software is built with a modern interface that allows for a unique layout and optimizes the display area for results and quick access to all features.
TEAM™ EDS software includes Smart features that provide industry-leading analytical intelligence allowing users to obtain higher quality and more reliable results. Among these features are: Smart Track, Smart Acquisition, Smart Phase Mapping, and Smart Data Review.
To optimize results for thin samples, Expert ID and MThin have been implemented in TEAM™ EDS software for the TEM. Expert ID is a revolutionary peak identification program, and MThin is a precise quantification algorithm for thin material.
Overall, TEAM EDS Smart features make the system more intuitive and easier to use, revolutionizing the way EDS analysis is done and effectively ensuring exceptional results every time, regardless of operator skill.
Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.
EDAX is a unit of AMETEK Materials Analysis Division—a division of AMETEK, Inc., a leading global manufacturer of electronic instruments and electromechanical devices with 2010 sales of $2.5 billion.
Posted by Lee Mather
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