Plasma profiling instrument from Horiba Scientific analyzes conductive and non-conductive materials

Nov. 11, 2015
The Plasma Profiling time-of-flight mass spectrometer (PP-TOFMS) provides chemical composition as a function of depth of solid materials.

The Plasma Profiling time-of-flight mass spectrometer (PP-TOFMS) provides chemical composition as a function of depth of solid materials. It provides standard-free, instantaneous semiquantification analysis of a sample with an atomic concentration range spanning orders of magnitudes in a single measurement. It can analyze conductive and non-conductive materials from inorganic to hybrid.
Horiba Scientific
Edison, NJ

www.horiba.com/scientific

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