The PEAK XNIR OEM near-infrared (near-IR) spectrometer uses digital light processing (DLP) technology and fused-silica transmission gratings to provide spectral programmability. Suited for process analytical technology (PAT), it has a retroreflective optical design, a cooled InGaAs detector, a 1650–2400 nm wavelength range, a numerical aperture of 0.22, resolution of 10 nm, and a 63 × 50 × 77 mm footprint.
Ibsen Photonics
Farum, Denmark