The 20/30 XL UV-visible-NIR microspectrophotometer nondestructively analyzes microscopic features of very large flat-panel displays by incorporating large-scale sample handling. With a spectral range from the deep-ultraviolet to the near-infrared, analysis of samples can be done by absorbance, reflectance, Raman, luminescence, and fluorescence.
CRAIC Technologies
San Dimas, CA