Software allows for nondestructive thin film measurement
FilmPro film thickness measurement software is designed to plug in to microspectrophotometers and their controlling Lambdafire software. It allows users to nondestructively measure the thickness of thin films, by either transmission or reflectance, of materials or substrates, such as semiconductors, MEMS devices, disk drives, and flat-panel displays. Sampling areas can range from >100 µm to <1 µm.
CRAIC Technologies
San Dimas, CA