Non-contact 3D optical profilometers from Chotest for form, waviness and roughness on optics, wafers, MEMS and precision parts. White-light interferometry gives roughness repeatability down to 0.005 nm RMS and step-height accuracy of 0.3%. Models include SuperView W1-Lite, W1, W1-Ultra, W2 and W3, WX100 probes and WT hybrid interferometry and confocal systems, with motorized XY stages up to 300 x 300 mm. Petrano Supply Inc. is an authorized distributor in Canada for Chotest.