Produces burn-in and lifetest systems for probed devices such as VCSEL arrays, laser arrays, APDs, chip-on carrier devices including photonics integrated curcuits (lasers, amphlifiers, modulators, photodiodes, thermistors) and more.
This burn-in, life-test, and qualification system provides a modular, temperature-controlled environment for testing multi-chip edge emitters, transceivers, p-i-n photodetectors...
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