Optical film thickness controllers and monitors single wavelength and spectral analysis. Programmable electron beam sweep eliminates tunneling in evaporants. Unique planetary tooling with dynamic masking results in 99.9% uniformity.
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Optical film thickness controllers and monitors single wavelength and spectral analysis. Programmable electron beam sweep eliminates tunneling in evaporants. Unique planetary tooling with dynamic masking results in 99.9% uniformity.