JA Woollam Co Inc

645 M St Suite 102
Lincoln, NE 68508
United States
402-477-7501
402-477-8214
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Offers multilayer and multiconstituent materials analysis by spectroscopic ellipsometry, in-situ real-time data acquisition and analysis, as well as research-grade ex-situ variable angle spectroscopic ellipsometry (VASE). Both fully automated, computer-controlled, 190- to 1700-nm spectral range. Measures film thicknesses, optical constants, alloy fractions, and surface and interfacial roughness. Measurement services available.

Articles

Beyond autonomous vehicles, there are other possible heat sensing or temperature measurement applications.
Modern IR-spectroscopic ellipsometry instruments and data analysis software provide accurate and repeatable thickness and optical property measurements of substrates and film ...
Increased wavelength coverage and computerized data analysis are opening new application areas for polarization measurements.

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