• JA Woollam Co Inc

    645 M St Suite 102
    Lincoln, NE 68508
    United States
    402-477-7501
    402-477-8214
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    More Info on JA Woollam Co Inc

    Offers multilayer and multiconstituent materials analysis by spectroscopic ellipsometry, in-situ real-time data acquisition and analysis, as well as research-grade ex-situ variable angle spectroscopic ellipsometry (VASE). Both fully automated, computer-controlled, 190- to 1700-nm spectral range. Measures film thicknesses, optical constants, alloy fractions, and surface and interfacial roughness. Measurement services available.

    Articles

    (Image credit: Talia Spencer)
    An artist's rendering shows light interacting with BTS crystals.
    Beyond autonomous vehicles, there are other possible heat sensing or temperature measurement applications.
    FIGURE 1. Shown here are the optical model (a), generated and experimental ψ-Δ fits (b), and n(λ) and k(λ) for the polymer film (c). The inset shows k(λ) for 2 to 10 mm. Absorptions at ~3 and 6 mm indicate the presence of water in the film.
    Modern IR-spectroscopic ellipsometry instruments and data analysis software provide accurate and repeatable thickness and optical property measurements of substrates and film ...
    By recording data at several wavelengths and angles, it is possible to determine the index of refraction and thickness of thin films. Modern spectroscopic ellipsometers can record this information in a short period of time, making them useful for real-time process control as well as for more traditional applications in characterization and quality control.
    Increased wavelength coverage and computerized data analysis are opening new application areas for polarization measurements.

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