Hinds Instruments to showcase imaging microscope at SPIE Photonics West 2018
The Exicor MicroImager imaging microscope can measure retardance from 0 to 315 nm in 7 seconds.
The Exicor MicroImager imaging microscope offers quantified microscopic polarization imaging data, with the ability to measure retardance from 0 to 315 nm in 7 seconds. When combined with the company's Phase Unwrapping algorithm and advanced four-wavelength system, measurements of up to 3500 nm of retardance for multiorder samples is possible.
To Learn More:
Headquarters: Hillsboro, OR
Product: Exicor MicroImager imaging microscope
Key Feature: Measures retardance from 0 to 315 nm in 7 seconds
What Hinds Instruments says:
View more information on the Exicor MicroImager imaging microscope.
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