Hinds Instruments to showcase imaging microscope at SPIE Photonics West 2018

The Exicor MicroImager imaging microscope can measure retardance from 0 to 315 nm in 7 seconds.

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The Exicor MicroImager imaging microscope offers quantified microscopic polarization imaging data, with the ability to measure retardance from 0 to 315 nm in 7 seconds. When combined with the company's Phase Unwrapping algorithm and advanced four-wavelength system, measurements of up to 3500 nm of retardance for multiorder samples is possible.

To Learn More:

Contact:Hinds Instruments

Headquarters: Hillsboro, OR

Product: Exicor MicroImager imaging microscope

Key Feature: Measures retardance from 0 to 315 nm in 7 seconds

What Hinds Instruments says:

View more information on the Exicor MicroImager imaging microscope.

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