Extended Spectral Response Aids Artwork Checks

Nov. 19, 2003
Croissy-Beaubourg, France, November 18, 2003. CEDIP Infrared Systems has published technical data establishing the considerable utility of its JADE SWIR IR camera system for the investigation and visualization of sub-surface preliminary artwork on paintings.

Croissy-Beaubourg, France, November 18, 2003. CEDIP Infrared Systems has published technical data establishing the considerable utility of its JADE SWIR IR camera system for the investigation and visualization of sub-surface preliminary artwork on paintings.

The use of IR reflectometry to non-destructively depth profile and visualize the primary intentions and techniques of artist's paintings is well established. However until now most IR cameras have demonstrated poor performance at longer wavelengths beyond 1.7 microns.

Using a advanced 320 x 240 pixel TE cooled MCT detector array the JADE SWIR camera provides excellent spectral response from 0.8 to 2.5 microns, with increasing performance towards the longer wavelengths. The key benefit of the extended spectral responsivity offered by the JADE SWIR is its ability to probe deeper into thick paint layers to reveal sub-surface preliminary artwork not visible below 1.7 microns.

For further information on this application and the JADE SWIR camera system contact CEDIP Infrared Systems www.cedip-infrared.com .

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