Bruker nanocharacterization system has utility in scattering scanning near-field optical microscopy
The second-generation Inspire IR nanocharacterization system features 10 nm spatial resolution IR chemical mapping in a laser-safe package. Designed for scattering scanning near-field optical microscopy (sSNOM), it uses proprietary EasyAlign and PeakForce Tapping technology, which correlates the nanoscale chemical information with a set of sample properties.
Bruker
Santa Barbara, CA
www.bruker.com