Bruker nanocharacterization system has utility in scattering scanning near-field optical microscopy

    Sept. 14, 2015
    The second-generation Inspire IR nanocharacterization system features 10 nm spatial resolution IR chemical mapping in a laser-safe package.

    The second-generation Inspire IR nanocharacterization system features 10 nm spatial resolution IR chemical mapping in a laser-safe package. Designed for scattering scanning near-field optical microscopy (sSNOM), it uses proprietary EasyAlign and PeakForce Tapping technology, which correlates the nanoscale chemical information with a set of sample properties.
    Bruker
    Santa Barbara, CA
    www.bruker.com

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