Anasys Instruments nanoscale spectroscopy and imaging system measures IR absorption

The nanoIR2-s nanoscale spectroscopy and imaging platform combines AFM-IR, a proprietary technique to measure nanoscale IR absorption, and scattering scanning near-field optical microscopy (s-SNOM).

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The nanoIR2-s nanoscale spectroscopy and imaging platform combines AFM-IR, a proprietary technique to measure nanoscale IR absorption, and scattering scanning near-field optical microscopy (s-SNOM). The s-SNOM addition allows sub-20 nm complex optical property mapping in graphene, 2D materials, photonics, and inorganic samples.
Anasys Instruments
Santa Barbara, CA

www.anasysinstruments.com

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