Anasys Instruments nanoscale spectroscopy and imaging system measures IR absorption
The nanoIR2-s nanoscale spectroscopy and imaging platform combines AFM-IR, a proprietary technique to measure nanoscale IR absorption, and scattering scanning near-field optical microscopy (s-SNOM). The s-SNOM addition allows sub-20 nm complex optical property mapping in graphene, 2D materials, photonics, and inorganic samples.
Anasys Instruments
Santa Barbara, CA
www.anasysinstruments.com