Detectors & Imaging

Olympus IMS to display laser confocal microscope system at SPIE Photonics West 2015

Jan. 29, 2015

The LEXT OLS4100 laser confocal microscope system delivers nanometer-level imaging, accurate 3D measurement, and surface roughness analysis.

LFW Staff

Content Dam Lfw Online Articles 2015 January Olympus Web

The LEXT OLS4100 laser confocal microscope system delivers nanometer-level imaging, accurate 3D measurement, and surface roughness analysis. Features include new auto brightness and high-speed stitching modes.

SPIE Photonics West booth number: 5322

To Learn More:

Contact: Olympus IMS
Headquarters: Center Valley, PA
Product: LEXT OLS4100 laser confocal microscope system
Key Features: Auto brightness and high-speed stitching modes

What Olympus IMS says:
View more information on the LEXT OLS4100 laser confocal microscope system.

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About the Author

LFW Staff

Published since 1965, Laser Focus World—a brand and magazine for engineers, researchers, scientists, and technical professionals—provides comprehensive global coverage of optoelectronic technologies, applications, and markets. With 80,000+ qualified print subscribers in print and over a half-million annual visitors to our online content, we are the go-to source to access decision makers and stay in-the-know.