Olympus IMS to display laser confocal microscope system at SPIE Photonics West 2015

Jan. 29, 2015
The LEXT OLS4100 laser confocal microscope system delivers nanometer-level imaging, accurate 3D measurement, and surface roughness analysis.

The LEXT OLS4100 laser confocal microscope system delivers nanometer-level imaging, accurate 3D measurement, and surface roughness analysis. Features include new auto brightness and high-speed stitching modes.

SPIE Photonics West booth number: 5322

To Learn More:

Contact: Olympus IMS
Headquarters: Center Valley, PA
Product: LEXT OLS4100 laser confocal microscope system
Key Features: Auto brightness and high-speed stitching modes

What Olympus IMS says:
View more information on the LEXT OLS4100 laser confocal microscope system.

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