Piezoelectric microscopy stage by Piezosystem Jena

June 5, 2012
Developer of micro and nanopositioning solutions, Piezosystem Jena (Jena, Germany), has introduced the PZ 300 AP z-positioner.

Developer of micro and nanopositioning solutions, Piezosystem Jena (Jena, Germany), has introduced the PZ 300 AP z-positioner. This low profile piezoelectric microscopy stage is designed to suit microscopy applications. It allows integration into most of the popular commercial motorized stages within upright and inverse microscopy assemblies. The stage opening supports sample holders and inserts that offer the multi-well standard. The stage is equipped with an interface that allows seamless integration into a standard Frame K opening (160x110mm²) of manual and motorized microscope stages. Due to its universal probe clamping, it accommodates any sample holders and inserts that have the standard multi-well size (128x86mm²). Its integrated direct measuring high resolution feedback system offers high accuracy and nonlinearity with reliable positioning stability and repeatability.

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CAP-measured multi-compatible z- positioner

Conception:

The low profile piezoelectrical microscopy stage is especially designed to suit microscopy applications e.g. super resolution microscopy and confocal fluorescence laser scanning. It allows seamless integration into most of the popular commercial motorized stages within upright and inverse microscopy assemblies. The stage opening supports sample holders and inserts that offer the multi-well standard e.g. multi-well and microtitre plates, slides, petri dishes, chambers, mini incubators... The sample plane is coincident to the illumination focus of inverted stages i.e. no condenser extender is necessary. Due to FEA optimization the dynamic behavior allows you to scan “step-by-step” at working frequencies up to 50Hz.

Advanced features:

The stage is equipped with an interface that allows seamless integration into a standard Frame K opening (160x110mm²) of manual and motorized microscope stages e.g. supported by Märzhäuser Scan IM series as well as Prior ProScan range. Due to its universal probe clamping it interchangeably accommodates any sample holders and inserts that have the standard multi-well size (128x86mm²). Its integrated direct measuring high resolution feedback system offers you the highest accuracy and nonlinearity and the most reliable positioning stability and repeatability.

Product highlights:

  • low profile piezoelectrical microscopy Z-stage
  • especially suited for confocal fluorescence laser scanning applications
  • offers a travel range of 300 microns
  • high resolution direct measuring capacitive metrology
  • fits a standard Frame K opening
  • supports standard multi-well size
  • no condenser extender necessity

Applications:

  • Fluorescence Microscopy, Confocal Microscopy, Laser Scanning Microscopy
  • 3D Imagination, Surface Topology, Superresolution Microscopy

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