Laser diode test system from Yelo has four separate ovens

Sept. 12, 2018
The Y4000 5000-channel laser diode test system is capable of production burn-in and accelerated life test of optoelectronic devices. 

The Y4000 5000-channel laser diode test system is capable of production burn-in and accelerated life test of optoelectronic devices. The 42U rack-based system accommodates low-power devices requiring up to 250 mA channel current, and can burn-in up to a temperature of 150°C. Its four separate ovens allow burn-in to be performed across four different temperature zones simultaneously if required.

Yelo

Carrickfergus, Northern Ireland

www.yelo.co.uk

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