Laser diode test system from Yelo has four separate ovens
The Y4000 5000-channel laser diode test system is capable of production burn-in and accelerated life test of optoelectronic devices.
Sep 12th, 2018
The Y4000 5000-channel laser diode test system is capable of production burn-in and accelerated life test of optoelectronic devices. The 42U rack-based system accommodates low-power devices requiring up to 250 mA channel current, and can burn-in up to a temperature of 150°C. Its four separate ovens allow burn-in to be performed across four different temperature zones simultaneously if required.
Yelo
Carrickfergus, Northern Ireland
