JPK Instruments combined AFM system applies and measures smallest forces in 3D

The OT-AFM Combi-System pairs the surface force measurement and imaging capabilities of atomic force microscopy with the ability of optical tweezers to apply and measure smallest forces in 3D. The two are on a single inverted light microscope platform. It can perform optical methods such as total internal reflectance microscopy and confocal fluorescence microscopy.
JPK Instruments
Berlin, Germany
www.jpk.com