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    1. Test & Measurement
    2. Test & Measurement

    JPK Instruments combined AFM system applies and measures smallest forces in 3D

    Feb. 16, 2017
    The OT-AFM Combi-System pairs the surface force measurement and imaging capabilities of atomic force microscopy with the ability of optical tweezers.
    LFW Staff
    Content Dam Lfw Online Articles 2017 02 1702lfw Pro 14 Web

    The OT-AFM Combi-System pairs the surface force measurement and imaging capabilities of atomic force microscopy with the ability of optical tweezers to apply and measure smallest forces in 3D. The two are on a single inverted light microscope platform. It can perform optical methods such as total internal reflectance microscopy and confocal fluorescence microscopy.
    JPK Instruments
    Berlin, Germany
    www.jpk.com

    About the Author

    LFW Staff

    Published since 1965, Laser Focus World—a brand and monthly magazine for engineers, researchers, scientists, and technical professionals—provides comprehensive global coverage of optoelectronic technologies, applications, and markets. With 80,000+ qualified print subscribers in print and over a half-million annual visitors to our online content, we are the go-to source to access decision makers and stay in-the-know.

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