Ellipsometer from Horiba Scientific has utility in thin film characterization
The UVISEL Plus is a modular ellipsometer with FastAcq acquisition technology, based on double modulation, for thin film characterization. Using new electronic data processing and a high-speed monochromator, the technology enables a sample measurement from 190 to 2100 nm to be completed within 3 minutes, at high resolution.
Horiba Scientific
Edison, NJ