Ellipsometer from Horiba Scientific has utility in thin film characterization

    Aug. 25, 2017
    The UVISEL Plus is a modular ellipsometer with FastAcq acquisition technology, based on double modulation, for thin film characterization. 
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    The UVISEL Plus is a modular ellipsometer with FastAcq acquisition technology, based on double modulation, for thin film characterization. Using new electronic data processing and a high-speed monochromator, the technology enables a sample measurement from 190 to 2100 nm to be completed within 3 minutes, at high resolution.

    Horiba Scientific

    Edison, NJ

    www.horiba.com/uviselplus

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