JDSU introduces optical test solution for labs and manufacturers

Sept. 18, 2007
September 18, 2007, Milpitas, CA and Berlin -- JDSU has announced the latest version of its variable optical attenuator for the JDSU Multiple Application Platform (MAP)

September 18, 2007, Milpitas, CA and Berlin -- JDSU has announced the latest version of its variable optical attenuator for the JDSU Multiple Application Platform (MAP). The MAP variable optical attenuator provides the industry's highest performance optical-power-level control solution with the lowest optical impairments and the fastest transition speed in its class (up to 25 dB/s). The product is on display this week at ECOC 2007 in Berlin, September 17-19 (booth 15087).

Because of massive traffic increases resulting from widespread deployment of broadband access technologies, equipment manufacturers are developing products that allow for higher bandwidth, longer reach, and greater flexibility. This leads to more complex devices that require more rigorous testing because of the increased number of operating states. These complex devices include reconfigurable optical add-drop multiplexers (ROADMs), high power erbium-doped fiber amplifiers (EDFAs), tunable transponders, and course-wavelength-division multiplexing/dense-wavelength-division multiplexing (CWDM/DWDM) transceivers that are designed to provide increased throughput, reduced costs, and improved reliability.

To validate these network systems and underlying subcomponents, test equipment must perform the required rigorous testing quickly and accurately. The latest MAP variable optical attenuator was designed with those constraints in mind. Performance features include ultralow insertion loss (less than 1.0 dB) plus industry-best wavelength flatness and transition speed. An optional built-in power monitor provides comprehensive closed-loop power control while the high power option is rated up to +33 dBm for single-mode fiber (+27 dBm for multimode fiber).

"Consumer and business demand for broadband services is not only a carrier issue because manufacturers are required to provide technologies that expand the performance and capacity of networks," said Bill Mortimer, vice president and general manager of JDSU's Lab & Production Test and Measurement group. "The speed, precision and reliability of the MAP variable optical attenuator will enable labs and equipment manufacturers to further respond to this challenge and help their customers attain a higher level of reliability, efficiency and cost savings."

The JDSU Multiple Application Platform (MAP)

The JDSU MAP is designed to help manage the test and measurement in an industry that requires flexibility and dynamic performance by offering researchers, designers, and manufacturing engineers a platform that exceeds all others with its modularity, reliability, and flexibility.

The MAP is a flexible instrumentation platform used for optical test and measurement applications that is available in two formats: a 19-inch 8-slot Master (MAP+2M00) and a 9.5-inch 3-slot Benchtop (MAP+2B00). They feature a common hot-swappable backplane compatible with over 15 different types of instrumentation cassettes. The MAP Master and MAP Benchtop include a 9-key keypad, color display, and remote communication ports.

MAP is used when instrumentation selection needs to be based on current requirements without compromising future requirements. The MAP+2B00 and MAP+2M00 provide the most cost-effective solutions for test sets requiring three or fewer cassettes and four to eight cassettes respectively. In both cases, future expansions are possible by populating the empty slots (if available) or adding a second independent MAP+2B00 or MAP+2M00.

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