June 21, 2006, Natick, MA,--Christopher J.L. Moore has been named General Manager of Philips Advanced Metrology Systems (Philips AMS). Previously serving as the product and marketing manager of Philips AMS, Moore has more than 20 years experience in semiconductor equipment sales and marketing management. He will be responsible for managing strategic growth, identifying key metrology problems in the semiconductor industry, and providing new proprietary measurement solutions when needed.
"We are very pleased to name Chris as the General Manager. He has been a key driver in moving the company into a leadership position in trench metrology and has been instrumental in building customer and partner relationships," said Harrie Brunklaus, senior vice president of Philips International of Royal Philips Electronics. "With his deep understanding of customer metrology requirements, we expect him to lead Philips AMS to even more success in the market."
Prior to joining Philips AMS, Moore served as director of marketing for the photoluminescence and x-ray diffraction division of Philips Analytical. As director of marketing, he was responsible for marketing initiatives related to Philips Analytical's range of metrology tools for the compound semiconductor industry. As manager of product and marketing for Philips AMS, Moore helped the company secure product orders from AMD and other large semiconductor manufacturers.