Horiba Scientific x-ray analytical microscope measures film thickness

The XGT-9000 x-ray analytical microscope simultaneously performs elemental analysis and optical observation of samples without destroying or contacting them.

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The XGT-9000 x-ray analytical microscope (µXRF) simultaneously performs elemental analysis and optical observation of samples without destroying or contacting them. Incorporating proprietary x-ray technology, it is equipped with bright-field coaxial, dark-field, and transmission optical illumination. It offers foreign object analysis, analyzes elements in semiconductor integrated circuits, and measures film thickness.

Horiba Scientific

Piscataway, NJ

www.horiba.com

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