Horiba Scientific x-ray analytical microscope measures film thickness

March 15, 2019
The XGT-9000 x-ray analytical microscope simultaneously performs elemental analysis and optical observation of samples without destroying or contacting them.
1903 Lfw Pro 16
1903 Lfw Pro 16
1903 Lfw Pro 16
1903 Lfw Pro 16
1903 Lfw Pro 16

The XGT-9000 x-ray analytical microscope (µXRF) simultaneously performs elemental analysis and optical observation of samples without destroying or contacting them. Incorporating proprietary x-ray technology, it is equipped with bright-field coaxial, dark-field, and transmission optical illumination. It offers foreign object analysis, analyzes elements in semiconductor integrated circuits, and measures film thickness.

Horiba Scientific

Piscataway, NJ

www.horiba.com

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