Horiba Scientific x-ray analytical microscope measures film thickness
March 15, 2019

The XGT-9000 x-ray analytical microscope (µXRF) simultaneously performs elemental analysis and optical observation of samples without destroying or contacting them. Incorporating proprietary x-ray technology, it is equipped with bright-field coaxial, dark-field, and transmission optical illumination. It offers foreign object analysis, analyzes elements in semiconductor integrated circuits, and measures film thickness.
Horiba Scientific
Piscataway, NJ
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