Horiba Scientific x-ray analytical microscope measures film thickness
The XGT-9000 x-ray analytical microscope (µXRF) simultaneously performs elemental analysis and optical observation of samples without destroying or contacting them. Incorporating proprietary x-ray technology, it is equipped with bright-field coaxial, dark-field, and transmission optical illumination. It offers foreign object analysis, analyzes elements in semiconductor integrated circuits, and measures film thickness.
Horiba Scientific
Piscataway, NJ