Interferometer for stitching from QED Technologies

July 6, 2012
The QED Interferometer for Stitching (QIS) system incorporates a proprietary coherent imaging system to obtain measurements with higher fringe densities and greater contrast.

The QED Interferometer for Stitching (QIS) system incorporates a proprietary coherent imaging system to obtain measurements with higher fringe densities and greater contrast. The optical design is engineered to reduce common errors, such as retrace and magnification errors. Greater focus travel allows measurement of parts with shorter radii than with a general purpose interferometer.
QED Technologies
Rochester, NY

[email protected]

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PRESS RELEASE

QED Technologies Announces Introduction of its QISTM Measurement System

ROCHESTER, NY - QED Technologies International Inc, (QED), pioneer and exclusive provider of Magnetorheological Finishing (MRF®) polishing and Subaperture Stitching Interferometry (SSI®) metrology platforms for the precision optics industry, announces the release of its QED Interferometer for Stitching (QISTM) system. The QIS system, developed and manufactured by QED Technologies, provides greater capabilities to QED’s metrology product line and is optimized for stitching.

"The development and production of QIS is a big step forward for QED and our customers,” said Andrew Kulawiec, President of QED Technologies. “Until now, our metrology systems have utilized a general purpose interferometer. However, increasing customer requirements led us to design, engineer and manufacture an interferometer specifically for stitching. As a result, we optimized the optical design, features and capabilities of the interferometer allowing us to further improve our stitching algorithms. Our customers now should be able to measure a greater variety of parts with improved accuracy, speed and ease of use."

QED’s QIS incorporates hardware and software features designed to enhance the performance of QED’s metrology products. The proprietary QIS coherent imaging system affords the user the ability to obtain measurements with higher fringe densities and greater contrast. The advanced optical design of QIS is engineered to reduce common errors, such as retrace and magnification errors. In addition, the greater focus travel provided by QIS allows for the measurement of parts with shorter radii than possible with a general purpose interferometer. QIS was also designed using the same software platform, QED.NET, as QED’s metrology and newest MRF systems, which enables seamless communications between systems. These features result in ease of use, efficient processing, increased accuracies and expanded capabilities. QIS is available on the new ASI(Q)TM platform, or as a field upgrade to existing ASI® and SSI-A® platforms.

To learn more about the QED Interferometer for Sttiching (QIS), contact Robin Townell, [email protected], (585) 758-0241.

About QED Technologies

Since it was founded in 1996, QED Technologies International Inc, based in Rochester, NY, has built a reputation for producing high quality products based on revolutionary, patented technology, advanced computer numerical control machines and world-class software to provide shop-ready solutions for nearly any precision optics manufacturing need. QED offers state-of-the-art finishing and metrology solutions that are designed to meet the needs of advanced optics manufacturers by increasing production speed and yield while decreasing costs. QED is dedicated to providing revolutionary technical solutions that enable or significantly enhance its customers’ capabilities and positively impact their bottom line. QED Optics offers precision optics polishing and metrology services on a contract basis, using QED’s MRF and SSI technologies. QED Technologies International Inc. is a wholly-owned subsidiary of Cabot Microelectronics Corporation (NASDAQ:CCMP). For more information about QED Technologies, contact Robin Townell, Marketing Manager, at (585) 758-0241

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