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    1. Test & Measurement
    2. Test & Measurement

    Metrology tool from Photal Otsuka Electronics measures yield

    Nov. 13, 2014
    The QE-2000 quantum efficiency measurement system from Photal Otsuka Electronics measures the yield of powders, liquids, solids, and films.
    LFW Staff
    Content Dam Lfw En Articles 2014 11 Metrology Tool From Photal Otsuka Electronics Measures Yield Leftcolumn Article Thumbnailimage File

    The QE-2000 quantum efficiency measurement system from Photal Otsuka Electronics measures the yield of powders, liquids, solids, and films. This metrology tools uses an integrating hemisphere and low stray- light array spectrometer with a wavelength range of 250 to 1100 nm. It can also measure excitation wavelength dependency, emission spectrum, FL excitation spectrum, and excitation emission matrix.
    SphereOptics
    Uhldingen, Germany
    www.sphereoptics.de

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    About the Author

    LFW Staff

    Published since 1965, Laser Focus World—a brand and monthly magazine for engineers, researchers, scientists, and technical professionals—provides comprehensive global coverage of optoelectronic technologies, applications, and markets. With 80,000+ qualified print subscribers in print and over a half-million annual visitors to our online content, we are the go-to source to access decision makers and stay in-the-know.

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