Metrology tool from Photal Otsuka Electronics measures yield
Nov. 13, 2014
The QE-2000 quantum efficiency measurement system from Photal Otsuka Electronics measures the yield of powders, liquids, solids, and films. This metrology tools uses an integrating hemisphere and low stray- light array spectrometer with a wavelength range of 250 to 1100 nm. It can also measure excitation wavelength dependency, emission spectrum, FL excitation spectrum, and excitation emission matrix.
SphereOptics
Uhldingen, Germany
www.sphereoptics.de
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