Mahr Federal optical surface measurement systems deliver subnanometer resolution
Aug. 1, 2014
Two new optical surface measuring systems provide non-contact 3D scanning and evaluation of surface details with subnanometer resolution. The MarSurf WM 100 offers white light interferometry, while the MarSurf CWM 100 offers white light and confocal microscopy. Uses include optical and reflecting surfaces as well as 3D topography, where high information density is required.
Mahr Federal
Providence, RI
www.mahr.com
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