Dynamic interferometer measures general and meter-class optics
October 27, 2008--Manufacturer of optical metrology instruments, 4D Technology (Tucson, AZ), has announced the introduction of the FizCam 2000 dynamic interferometer for measurement of general and meter-class optics. The FizCam 2000 is a high performance, Fizeau interferometer with a 12-inch (300 mm) aperture for accurate measurement of large-diameter, flat optics, such as those used in terrestrial and space-based astronomy, and surveillance, among other applications.
Unlike traditional phase-shifting interferometers, which typically require hundreds of milliseconds per measurement, the FizCam 2000 utilizes "dynamic interferometry" to acquire all measurement data in less than 1 millisecond. Because acquisition time is so short, the FizCam is insensitive to vibration and air turbulence, enabling use in difficult environments, without additional isolation.
The system's completely on-axis design eliminates the inherent aberrations, software corrections, and alignments typical with tilted beam Fizeau systems. Its proprietary laser source enables measurements which would otherwise be difficult or impossible, such as measurement of thin, plane-parallel glass. The FizCam can also measure "remote cavities," in which both the test and reference surfaces are physically separated from the interferometer.
The FizCam 2000 is a turnkey instrument that includes the interferometer, 4Sight analysis software, and a complete high-speed computer system. The system offers true 4X motorized optical zoom imaging and remote control of focus and zoom. Optional 12-in. tip/tilt mounts are also available for the reference and test optics.
The 4Sight advanced wavefront analysis software included with the FizCam 2000 provides extensive two-dimensional (2D) and three-dimensional (3D) analysis and visualization tools, as well as comprehensive filtering, masking, database, and import/export functions.
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