Edmund Optics announces new UV-to-near-IR spectrometers

Aug. 25, 2008
New back-thinned CCD spectrometer designed for low-light-level, hyperspectral, high-resolution applications.

Producer of optics, imaging, and photonics technology Edmund Optics (Barrington, NJ) has announced new spectrometers with a wide dynamic range, improved quantum efficiency, and optimal signal-to-noise ratio. The instrument covers a spectral range from 190 nm to 1100 nm.

"The versatile back-thinned CCD spectrometer is a cost effective solution for wide spectral measurements that are typically covered by multiple front-illuminated CCD's," says product line manager Amr Khalil. "The back-thinned structure improves illumination level, thus increasing the CCD dynamic range and scan speed."

The spectrometer also minimizes stray light by incorporating a holographic aberration-corrected flat-field concave grating and optimized optical bench, which reduces noise and improves throughput.

The spectrometer offers 2 nm full-width-half-max (FWHM) spectral resolution, wavelength accuracy of +/-0.5 nm and a slit width of 25 µm. Optical input can be supplied through an SMA905 connector. A plug-and-play USB interface provides ease of use, and the instrument is supplied with software that allows users to configure it for either a large dynamic range or high sensitivity operation.

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About the Author

John Wallace | Senior Technical Editor (1998-2022)

John Wallace was with Laser Focus World for nearly 25 years, retiring in late June 2022. He obtained a bachelor's degree in mechanical engineering and physics at Rutgers University and a master's in optical engineering at the University of Rochester. Before becoming an editor, John worked as an engineer at RCA, Exxon, Eastman Kodak, and GCA Corporation.

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