Veeco introduces OEM optical metrology module

Sept. 6, 2001
The system offers accurate in-situ production metrology for fiberoptic and other manufacturing applications.

Veeco Metrology Group (Santa Barbara, CA) has introduced a Wyko optical metrology module (OMM) for in-situ metrology in high-volume production environments for OEM applications. The OMM provides accurate process control metrology where it is needed most on the production floor. Features include high-speed, noncontact topography measurements for feature heights from 0.1 nm up to 2mm and for fields of view up to 8 mm square on advanced surfaces.

The new module utilizes the field-proven interferometry techniques that power Wyko optical profilers and is a stand-alone module designed to easily integrate into production equipment. When integrated, the gauge-capable OMM provides closed-loop feedback, minimizes part handling, and meets critical measurement requirements for a wide range of applications, such as fiber optics, optical filters, and more. The OMM supports both phase-shifting and white light interferometry.

The OMM interface – featuring self-contained tip/tilt, illumination, auto-focus, and motorized turret – mates easily with new and existing machinery and handling equipment. Ethernet-based architecture allows access from a remote computer, and customizable recipes enable complete control of automated measurement runs.

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