Scanning thermal microscope

    May 1, 1995
    The Scanning Thermal Microscope probe measures the thermal conductivity and surface temperatures of samples with nanoscale spatial resolution. The probe can be added to the Model TMX 2000 scanning probe microscope without affecting the microscope?s ability to produce high-resolution surface images. Material scientists can measure grain boundaries, grains, intergranular phases, powder particles, and functional gradient coatings.

    The Scanning Thermal Microscope probe measures the thermal conductivity and surface temperatures of samples with nanoscale spatial resolution. The probe can be added to the Model TMX 2000 scanning probe microscope without affecting the microscope?s ability to produce high-resolution surface images. Material scientists can measure grain boundaries, grains, intergranular phases, powder particles, and functional gradient coatings.

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