Scanning thermal microscope

The Scanning Thermal Microscope probe measures the thermal conductivity and surface temperatures of samples with nanoscale spatial resolution. The probe can be added to the Model TMX 2000 scanning probe microscope without affecting the microscope?s ability to produce high-resolution surface images. Material scientists can measure grain boundaries, grains, intergranular phases, powder particles, and functional gradient coatings.

May 1st, 1995

The Scanning Thermal Microscope probe measures the thermal conductivity and surface temperatures of samples with nanoscale spatial resolution. The probe can be added to the Model TMX 2000 scanning probe microscope without affecting the microscope?s ability to produce high-resolution surface images. Material scientists can measure grain boundaries, grains, intergranular phases, powder particles, and functional gradient coatings.

Frame grabber

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