Atomic force microscope

The NanoScope Dimension 3000 atomicforce microscope (AFM), usable for samples with diameters u¥to 8 in., provides good resolution and spatial linearity. The device supports every available AFM/STM technique. Samples can be analyzed manually or automatically in air or liquid. Topview video optics and a motorized zoomlens system ensure the rapid location of areas of interest. A lasertracking system, called TrakScan, monitors the scanningprobe ti¥and makes setu¥and alignment easy. The Dimension 3000 AFM is suitable for inspection and analysis of datastorage devices, semiconductors, optics, biomaterials, optics, and any other surface that requires fine topographical mapping.

High-speed digital CCD camera