Variable-pressure SEM

Oct. 1, 1995
The S-3200N Variable Pressure Scanning Electron Microscope permits users to switch between conventional high-vacuum mode and variable-pressure mode. In the latter, the computer-controlled vacuum system changes from atmospheric pressure to low vacuum (from 0.01 to 2 torr). The SEM`s column design and tungsten emitter give high-resolution images at 1 kV.

Variable-pressure SEM

The S-3200N Variable Pressure Scanning Electron Microscope permits users to switch between conventional high-vacuum mode and variable-pressure mode. In the latter, the computer-controlled vacuum system changes from atmospheric pressure to low vacuum (from 0.01 to 2 torr). The SEM`s column design and tungsten emitter give high-resolution images at 1 kV.

Hitachi Scientific Instruments, Mountain View, CA

Sponsored Recommendations

Brain Computer Interface (BCI) electrode manufacturing

Jan. 31, 2025
Learn how an industry-leading Brain Computer Interface Electrode (BCI) manufacturer used precision laser micromachining to produce high-density neural microelectrode arrays.

Electro-Optic Sensor and System Performance Verification with Motion Systems

Jan. 31, 2025
To learn how to use motion control equipment for electro-optic sensor testing, click here to read our whitepaper!

How nanopositioning helped achieve fusion ignition

Jan. 31, 2025
In December 2022, the Lawrence Livermore National Laboratory's National Ignition Facility (NIF) achieved fusion ignition. Learn how Aerotech nanopositioning contributed to this...

Nanometer Scale Industrial Automation for Optical Device Manufacturing

Jan. 31, 2025
In optical device manufacturing, choosing automation technologies at the R&D level that are also suitable for production environments is critical to bringing new devices to market...

Voice your opinion!

To join the conversation, and become an exclusive member of Laser Focus World, create an account today!