Variable-pressure SEM
The S-3200N Variable Pressure Scanning Electron Microscope permits users to switch between conventional high-vacuum mode and variable-pressure mode. In the latter, the computer-controlled vacuum system changes from atmospheric pressure to low vacuum (from 0.01 to 2 torr). The SEM`s column design and tungsten emitter give high-resolution images at 1 kV.
Hitachi Scientific Instruments, Mountain View, CA