Contact surface profiler

The Automated ConnectChek Interferometer System (ACCIS) is a contact surface profiler that measures variations in the surface contours of PCpolished fiberoptic connectors, analyzing the topography in three dimensions. The unit measures fiber height to ۪.01µm accuracy, radius of curvature to ۫.0 mm, and eccentricity to 䔮.0 µm. Designed to serve both laboratory and production environments, ACCIS is capable of automatically characterizing the endface of a PC or APCpolished connector and calculating its physical parameters. The system includes a FabryPerot interferometric microscope, a 486based microcomputer, frame grabber, and dedicated softwar