The t-Master thermal-conductivity meter is designed for use with thin films. Nondestructive accurate measurements of films as thin as 100 nm are possible, and the instrument includes configurations for a wide range of structures. The minimum thermal resistance that can be measured is 10-7 m2K/W. The tableto¥instrument consists of the meter itself and a coating unit. No vacuum equipment is required, and measurements can be completed in less than 10 min.
Inrad, Northvale, NJ