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    1. Test & Measurement
    2. Test & Measurement

    Scanning probe microscope

    March 1, 1998
    A large-sample scanning probe microscope regularly accepts samples as large as 6 ¥ 6 ¥ 1 in. (150 ¥ 150 ¥ 25 mm) onto a manual x-y stage. The translator and support block can be removed without tools to allow the instrument to accommodate samples as large as 11 in. wide and 4 in. high. The VISTA-100`s mechanical design and the integration of the microscope controller into the computer chassis are designed to allow a small footprint. The instrument uses a gradient index lens to pr

    Scanning probe microscope

    A large-sample scanning probe microscope regularly accepts samples as large as 6 ¥ 6 ¥ 1 in. (150 ¥ 150 ¥ 25 mm) onto a manual x-y stage. The translator and support block can be removed without tools to allow the instrument to accommodate samples as large as 11 in. wide and 4 in. high. The VISTA-100`s mechanical design and the integration of the microscope controller into the computer chassis are designed to allow a small footprint. The instrument uses a gradient index lens to provide a view of the sample area and to focus the laser spot on the cantilever probe.

    Burleigh Instruments, Fishers, NY

    For FREE Data Circle 415

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