May 1, 2008, Middlefield, CT-- Zygo Corporation has announced that Dr. Peter de Groot, ZYGO's director of research and development, has been elected a Fellow of SPIE, the international society for the science and application of light. Dr. de Groot received this honor in recognition of his many contributions in high-precision interferometry, a core ZYGO technology.
Bruce Robinson, ZYGO's chairman and CEO, stated, "We are proud to have an individual of Dr. de Groot's technical stature on our R&D team. Peter is a driving force behind our semiconductor initiative, and provides ZYGO with strong technical leadership in this fast-paced market."
The SPIE nomination noted, "Dr. de Groot is the inventor and developer of optical metrology tools for inspecting a range of optical and engineering surfaces from MEMS devices to airplane wings--with more than 75 patents issued and pending and four R&D 100 Awards to his name, he is truly a prolific and leading inventor in the optical metrology arena."
Each year, SPIE promotes 72 new Fellows of the Society from within its membership. Fellows are Members of distinction who have made significant scientific and technical contributions in the multidisciplinary fields of optics, photonics, and imaging. They are honored for their technical achievement, for their service to the general optics community, and to SPIE in particular. SPIE represents more than 188,000 active constituents in 138 different countries.
For more information on this year's SPIE fellows, visit http://spie.org/x32.xml.
--V.C.