Atlanta, GA--Scanning probe and optical microscopy manufacturer WITec (Ulm, Germany) last week won the Pittcon 2011 Editor's Gold Award for the most outstanding new product. The new WITec True Surface Microscopy mode was selected by a panel of more than 150 editors registered at the Pittcon conference and exhibition for analytical istrumentation. The award honors the most significant and important technological advancement introduced at the exhibition. True Surface Microscopy was chosen due to its ability to simplify the Raman Imaging process on large, rough or inclined samples.
The innovative WITec instrument combines confocal Raman imaging with surface topography to keep the Raman spectrometer precisely focused, even on odd-shaped surfaces. Topographic coordinates from an optical profilometer measurement are used to perfectly follow the sample surface in confocal Raman imaging mode. According to the company, the result is an image revealing optical or chemical properties at the surface of the sample, even if this surface is very rough or heavily inclined. Samples that had previously required extensive preparation in order to obtain a certain surface flatness can now be automatically characterized as they are.
"We are absolutely delighted and nearly overwhelmed to receive such a well respected award," said Dr. Joachim Koenen, Managing Director of WITec. "This is a great motivation to continue our successful philosophy of constantly introducing new technologies to provide our customers with cutting edge technology for their research."
Source: WITec