Waveguide Laser: Yb-doped waveguide lases near 1 µm

Jan. 1, 2006
For what they believe to be the first time, researchers at the Ecole Polytechnique Fédérale de Lausanne (Lausanne, Switzerland) and the Max-Born-Institute for Nonlinear Optics and Ultrafast Spectroscopy (Berlin, Germany) have demonstrated laser operation of an ytterbium (Yb)-doped waveguide composed of an oxide of potassium (K), yttrium, and tungsten (W) of the specific formula KY(WO4)2-more commonly referred to as Yb:KYW.

For what they believe to be the first time, researchers at the Ecole Polytechnique Fédérale de Lausanne (Lausanne, Switzerland) and the Max-Born-Institute for Nonlinear Optics and Ultrafast Spectroscopy (Berlin, Germany) have demonstrated laser operation of an ytterbium (Yb)-doped waveguide composed of an oxide of potassium (K), yttrium, and tungsten (W) of the specific formula KY(WO4)2more commonly referred to as Yb:KYW.1 Continuous-wave (CW) emission was achieved for both surface and buried planar waveguides. “The slope efficiency of the Yb:KYW waveguide laser is as high as 80.4%, which is, to the best of our knowledge, the highest value ever reported for a dielectric waveguide laser,” notes researcher Yaroslav Romanyuk.

To achieve high-power lasing, the researchers fabricated high-quality Yb-doped waveguides using the KYW double tungstate crystal composite. Because large-area defect-free thin layers on a suitable substrate are essential to achieving low-loss propagation of light within the waveguide, a liquid-phase epitaxy (LPE) growth technique was employed in which a single-crystal layer is grown from a molten solution on an oriented single-crystal substrate.

Normally, LPE of rare-earth-ion-doped KYW layers using a low-temperature chloride solvent causes insertion defects that limit the maximum layer thickness to 10 µm and cause poor interface quality between layers. To improve the crystal quality, the researchers used a tungstate solvent (K2W2O7) and a vertical dipping technique with partial immersion of the substrate to better control the uniformity of the grown layer on the 1-mm-thick undoped KYW substrate. Single-crystalline layers of thickness 10 to 100 µm and Yb3+ doping concentrations between 1.2 and 2.4 at.% were grown at a rate of 18 µm per hour. Spectroscopy confirmed the calculation that the refractive-index change of a 1.8-at.% Yb-doped layer with respect to the undoped substrate was 6 × 104.

To obtain active, buried waveguide structures, several doped layers were overgrown with 20-µm-thick undoped layers to create a symmetric refractive-index profile. The polished end face shows that interfaces are sharp and straight without any detectable defects (see figure). Testing the layers as active and passive planar waveguides using a 980-nm pump laser and imaging the output onto a CCD camera showed that at least three TE modes could be supported by a 22-µm-thick planar buried waveguide in the vertical direction.

Two waveguides

For laser experiments, two 17-µm-thick and 6-mm-long waveguides were chosen, with polished surfaces and end faces. One was a 2.4-at.% buried waveguide and the other was a 1.2-at.% surface waveguide. In an astigmatically compensated z-shaped cavity, the waveguide was positioned at the Brewster angle between two folding mirrors with a 10‑cm radius of curvature that focused the resonator waist at both end faces of the waveguide to reduce diffraction losses. Pumping the waveguides with a 980.5-nm Ti:sapphire laser produced a stable CW oscillation near 1025 nm for both waveguides, with a 95% linearly polarized output.

Although the buried waveguide should have exhibited lower propagation losses, its performance was slightly inferior to the surface waveguide-probably because of the higher doping concentration that can lead to higher reabsorption losses. For the surface waveguide, 80 mW of absorbed pump power produced a maximum output of 290 mW.

With waveguide losses calculated to be 0.08 dB/cm for the multimode waveguide structure, the laser output is close to the diffraction limit as determined by the observed far-field intensity distribution. The waveguide was mounted on a copper plate without cooling during the experiments.

REFERENCE

1. Y. E. Romanyuk et al., Optics Lett. 31(1), 53 (Jan.1, 2006).

About the Author

Gail Overton | Senior Editor (2004-2020)

Gail has more than 30 years of engineering, marketing, product management, and editorial experience in the photonics and optical communications industry. Before joining the staff at Laser Focus World in 2004, she held many product management and product marketing roles in the fiber-optics industry, most notably at Hughes (El Segundo, CA), GTE Labs (Waltham, MA), Corning (Corning, NY), Photon Kinetics (Beaverton, OR), and Newport Corporation (Irvine, CA). During her marketing career, Gail published articles in WDM Solutions and Sensors magazine and traveled internationally to conduct product and sales training. Gail received her BS degree in physics, with an emphasis in optics, from San Diego State University in San Diego, CA in May 1986.

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