Electro-optic wafer tester accommodates automatic wafer loading
A 30-mm double-sided electro-optical wafer tester works with existing semiconductor ATE architectures for AI-driven silicon photonics computing. The optical test cell directly docks with the ATE at a core software and hardware level. It accommodates automatic wafer loading, has a patented vacuum thermal control chuck assembly, in situ fiber array calibration, end-face inspection, and automated photonic integrated circuit (PIC) mapping.
ficonTEC
Achim, Germany