The TS 1000 and TSC 1000 automatic laser-diode test stations are available with menu-driven software. The systems can provide fast analysis of L/I, V/I, and L/IPD with full 16-bit resolution. A laser diode is characterized with 30 points each second, and the results can be presented in a pass/fail table. Test stations are available with two independent temperature controllers, one for the laser chi¥and one for the laser housing.
Profile Optische Systeme GmbH, Karlsfeld, Germany