• Thin-film software

    FilmSpectrum is a program that analyzes and characterizes thin films based on spectrophotometric data. The program allows simultaneous solution of index of refraction, extinction coefficient, and film thickness. The program can provide automated data acquisition from several spectrophotometer models, as well as providing tools for customizing the acquisition to unsupported instruments. Both single and multilayer films can be characterized, including SOI, SOS, SiNx, SiOx, DLC, SOG, photo resist,
    Nov. 1, 1997

    Thin-film software

    FilmSpectrum is a program that analyzes and characterizes thin films based on spectrophotometric data. The program allows simultaneous solution of index of refraction, extinction coefficient, and film thickness. The program can provide automated data acquisition from several spectrophotometer models, as well as providing tools for customizing the acquisition to unsupported instruments. Both single and multilayer films can be characterized, including SOI, SOS, SiNx, SiOx, DLC, SOG, photo resist, amorphous-silicon, amorphous hydrogenated carbon, polysilicon, ITO, and antireflective films.

    Scientific Computing International, Encinitas, CA

    Sign up for Laser Focus World Newsletters
    Get the latest news and updates.

    Related

    Case Study: Custom Microlens Arrays Design
    High-Precision Optical Design for Wide Spectrum Star Trackers | Avantier
    Hexapod 6-DOF Active Optical Alignment Micro-Robots - Enablers for Advanced Camera Manufacturing
    Sponsored
    Laser Assisted Wafer Slicing with 3DOF Motion Stages
    Sponsored

    Voice Your Opinion!

    To join the conversation, and become an exclusive member of Laser Focus World, create an account today!