Characterization tool

FilmTek 2000 combines a fiberoptic-based spectrophotometer with a dee¥UV to NIR range with material modeling software to provide a tool for measuring film thickness, surface roughness, index of refraction, and extinction coefficient. Nearly all translucent films ranging in thickness from less than 2.5 nm to about 50 µm can be measured.

Characterization tool

FilmTek 2000 combines a fiberoptic-based spectrophotometer with a dee¥UV to NIR range with material modeling software to provide a tool for measuring film thickness, surface roughness, index of refraction, and extinction coefficient. Nearly all translucent films ranging in thickness from less than 2.5 nm to about 50 µm can be measured.

Scientific Computing International, Encinitas, CA

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