Diode-laser test system
The Automated Laser Characterization System tests and characterizes laser diodes automatically. The computer-controlled system measures a laser`s near-field and far-field and can measure wavelength spectrum using an optional spectrum analyzer. Power/voltage vs. current and other curves, which can be used to derive the laser`s threshold current, slope efficiency, and series resistance, can also be measured. The system uses MS-Windows-based software for positioning, test, alignment, and diagnostic system control. The entire measurement sequence takes less than 5 min.
E-Tek Dynamics, San Jose, CA