Meller Optics introduces x-ray-diffraction analysis of crystalline optical materials

Aug. 24, 2010
If you happen to be looking for an analysis of the crystalline structure of your single-crystal optical material, you might want to check with Meller Optics. 

Providence, RI--If you happen to be looking for an analysis of the crystalline structure of your single-crystal optical material, you might want to check with Meller Optics. The company does x-ray-diffraction analysis to find the structural orientation of crystalline samples supplied by customers, and can also correct a plane on the sample if necessary.

Meller's x-ray single-crystal diffraction analysis uses x-ray-diffraction goniometry to measure a specific sample plane as requested by the customer, and provides a flat reference to a 2 to 3 arc-minute accuracy. The measurement can be dome for samples from 0.25 in. square and made of materials such as sapphire, single-crystal quartz, silicon, magnesium fluoride (MgF2), calcium fluoride (CaF2), barium fluoride (BaF2), and spinel. As well as correcting a plane, Meller can provide a reference flat, if desired. Quotations are provided upon request.

For more information, go to www.melleroptics.com

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About the Author

John Wallace | Senior Technical Editor (1998-2022)

John Wallace was with Laser Focus World for nearly 25 years, retiring in late June 2022. He obtained a bachelor's degree in mechanical engineering and physics at Rutgers University and a master's in optical engineering at the University of Rochester. Before becoming an editor, John worked as an engineer at RCA, Exxon, Eastman Kodak, and GCA Corporation.

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