Scanningprobe microscope

    Nov. 1, 1994
    The NanoScope E scanningprobe microscopy systems can be configured for contact atomicforce, lateralforce, and scanningtunneling microscopy for use in scientific and other applications. The lowcost NanoScope E series can be upgraded to the fully configured NanoScope III system.

    The NanoScope E scanningprobe microscopy systems can be configured for contact atomicforce, lateralforce, and scanningtunneling microscopy for use in scientific and other applications. The lowcost NanoScope E series can be upgraded to the fully configured NanoScope III system.

    Visible laser diode

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